European Journal of Applied Engineering and Scientific Research
Abstract
Author(s): Pradeep Kamble, Vijaya Puri
Wave guide reflectometer and voltage standing wave ratio (VSWR) methods have been used to study the X band (8-
12 GHz) microwave perturbation and permittivity of leaf stem material of Ficus Bengalanesis. The effect of moisture
content has been investigated on the stem taken from two places in the branch. The transmittance of the waveguide
decreases and reflectance increases due to the stem. The perturbations in the reflection mode are highly frequency
dependent. The real permittivity ?Ž?µ?¢???? of the stem has a value of ~ 80 and ?Ž?µ?¢??? is ~ 180 at ~ 10 GHz. Beyond 10 GHz the
dielectric constant shows frequency dependent variations. The permittivity decreases with decrease in moisture
content in the stem. The microwave impedance shows both capacitive and inductive reactance varying randomly
with frequency and moisture content.
