The CdTe thin films were prepared by chemical bath deposition technique, also known as solution growth technique using commercial glass as substrate at 358K bath temperature using cadmium acetate andtellurium dioxide. Characterization was done by X-ray diffraction method, the scanning electron microscope (SEM) micrographs, optical spectrophotometer and the quantitative analysis using the energy dispersive X-ray analysis (EDAX). X-ray diffraction study indicates the hexagonal structure. The band gap calculated from optical spectra was found to be 1.41eV. The EDAX peaks shows the presence of Telluriumand Cadmiumin the as-deposited thin film of CdTe.
