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Structural, Optical and Electrical Properties of Nanocrystalline ZnS thin films Deposited by Novel Chemical Route | Abstract
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Abstract

Structural, Optical and Electrical Properties of Nanocrystalline ZnS thin films Deposited by Novel Chemical Route

Author(s): M. S. Shinde, P. B. Ahirrao, R. S. Patil

Semiconducting Zinc sulphide (ZnS) thin films were deposited on glass substrate using relatively
simple, quick chemical bath deposition method (CBD) using the mixed aqueous solution of zinc
sulphate, thiourea and ammonia. The ammonia was used as the complexing agents. The
preparative parameters such as concentration, temperature, deposition time, pH of solution have
been optimized. Thin film of ZnS with different thickness were prepared by changing the
deposition time at 850c. The characterization of thin films was carried out for the structural,
surface morphological, optical and electrical properties. The thin films we characterized by
using X-ray diffraction (XRD), Scanning electron microscopy (SEM), UV-VIS Spectra and d.c.
two point probe method. The effect of thin film thickness on optical and electrical properties has
been studied.

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