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Effects of mask material conductivity on lateral undercut etching in- silicon nano-pillaretching | Abstract
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European Journal of Applied Engineering and Scientific Research

Abstract

Effects of mask material conductivity on lateral undercut etching in- silicon nano-pillaretching

Author(s): Ripon Kumar -Dey

High aspect ratio silicon structures have gained significant interest due to its vast applications. Minimal lateral etch under the mask is essential to achieve very high aspect ratio silicon nanostructures. Previously, we reported that chromium oxide is better than metallic chromium as a hard mask for silicon etching in terms of etch rate and selectivity to resist during mask structure fabriction.