Optical and AFM studies on Lead Selenide thin films

By N. Suriyanarayanan, S. Prabahar, S. Srikanth, V. Balasubramanian and D. Kathirvel

ABSTRACT


Thin films of PbSe of different thicknesses have been prepared on glass substrates at room temperature by vacuum deposition. The thickness of the deposited films was measured by employing quartz crystal monitor method. The optical properties have been studied in the range of wavelength 2500-5000nm.The optical band gap, absorption coefficient extinction coefficient values of different thicknesses have been estimated and reported in this paper. The surface morphology of the films is investigated by means of atomic force microscopy (AFM).

Keywords:  Optical Properties,   Atomic force microscopy, Vacuum deposition.

 

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