By S. G. Pawar, S. L. Patil, M. A. Chougule, D. M. Jundhale, V. B. Patil
Titanium oxide thin films have been deposited by spin coating technique and then have been analyzed in order to study structural, microstructural, optical and electrical properties In particular their spectrophotometric and conductivity measurements have been performed in order to determine the optical and electrical properties of titanium oxide thin films. The structure and the morphology of such material have been investigated by SEM, high resolution electron microscopy and small area electron diffraction, AFM.
Key Words : TiO2, thin films, sol gel, spin coating, XRD, SEM, HRTEM, AFM
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